Regensburg 2004 – wissenschaftliches Programm
O 34.6: Vortrag
Donnerstag, 11. März 2004, 12:30–12:45, H45
High-resolution core-level spectroscopy and LEED investigations of Ga2O3 on CoGa(100) surface — •Alina Vlad1, I. Costina1, A. Stierle1, H. Dosch1, E. Lundgren2, and J. Anderson2 — 1Max-Planck Institut für Metallforschung, Heisenbergstraße 1, 70569 Stuttgart — 2Department of Synchrotron Radiation Research, Institute of Physics, University of Lund, Box 118, SE-221 00 Lund, Sweden
Ultra-thin oxide films are of interest for fundamental studies, as well as for industrial applications in sectors like heterogeneous catalysis, microelectronics, high-density data storage technologies. As an example, we investigated the thermally controlled oxidation of CoGa(100) using High Resolution Core Level Spectroscopy (HRCLS) and Low Energy Electron Diffraction (LEED) techniques. HRCLS measurements have been performed after oxidation at different temperatures up to 750oC and pressures between 10−8 and 5 · 10−5 mbar O2 on the beamline I 311 at the Max-lab II, Sweden. After the oxidation at 450oC an ordered ultra-thin oxide layer is formed, which shows in LEED a (2 x 1) reconstruction. After the oxidation at 750oC and 5 · 10−5 mbar O2, the LEED patterns indicate the change in the surface orientation of the oxide layer accompanied by surface faceting. Also, an additional component shifted to higher binding energy was observed both in Ga 3d and O 1s spectra.