Regensburg 2004 – wissenschaftliches Programm
O 42.1: Hauptvortrag
Freitag, 12. März 2004, 10:15–11:00, H36
Reflectance Difference Spectroscopy : a powerful tool for surface analysis — •Michael Hohage — Institute of Experimental Physics, Johannes Kepler University Linz, A-4040 Linz, Austria
Reflectance Difference Spectroscopy (RDS) measures the in plane optical anisotropy of a surface or a thin film by analysing the reflection of linearly polarised light under normal incidence. Only recently, the scope of this method has been extended to study anisotropic metal surfaces. Since the bulk of cubic crystals is optically isotropic, the RDS signal from such crystals arises exclusively from symmetry breaking surfaces (e.g. Cu(110)) and interfaces. Indeed, RDS turned out to be a versatile and surface sensitive in-situ tool to analyse the electronic structure of anisotropic metal surfaces as well as to study growth and adsorption on such surfaces. The RDS signal is extremely sensitive to surface state transitions, surface modified bulk transitions and adsorbate specific transitions, each located at characteristic transition energies. These different and spectroscopically separable contributions can be utilised to monitor adsorption and growth processes in real time as well as to identify surface phase transitions simultaneously.