Regensburg 2004 – wissenschaftliches Programm
SYOH 5.74: Poster
Donnerstag, 11. März 2004, 18:00–21:00, B
Spectromicroscopic Characterisation of All Polymer Transistor Structures — •Klaus Mueller, Yevgen Burkov, and Dieter Schmeisser — BTU Cottbus, Angewandte Physik-Sensorik, 03013 Cottbus, P.O.Box 101344
In order to optimize organic field effect transistors, the characterization of surfaces in terms of their roughness or chemical composition is very important. We report on high resolution spectromicroscopic mapping of organic thin film transistors by photoemission electron microscopy (PEEM). It was shown that PEEM is a useful technique to characterize the surface morphology (roughness), the chemical homogeneity or the composition of structures in between the source and drain electrodes. Mapping of surface potentials, especially at the interface electrode/channel is possible. We compare different preparation methods and the characterization at applied voltages is also shown.
The transistors itself were prepared by a new low cost method. The electrodes for source and drain have been prepared by a plotting method with colloidal graphite or carbon black as the conducting material. P3HT was used as active layer and has been prepared by spin coating.