Regensburg 2004 – wissenschaftliches Programm
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SYXM: X-RAY Magneto-Optics
SYXM 1: X-Ray Magneto-Optics
SYXM 1.1: Hauptvortrag
Dienstag, 9. März 2004, 14:30–15:00, H1
Magneto-optical polarisation spectroscopy with soft x-rays — •Hans-Christoph Mertins1, Sergio Valencia2, Andreas Gaupp2, Wolfgang Gudat2, and Peter Oppeneer3 — 1University of Applied Sciences, Münster, Stegerwaldstr. 39, 48565 Steinfurt — 2BESSY, Berlin, Germany — 3IFW-Dresden, Germany
Among the x-ray magneto-optical spectroscopy techniques, the polarisation analysis of light after its interaction with the material gaines increasing importance since it reveals both, the intensity and the phase. Thus it directly gives the complete magneto-optical constants, something that is not possible with a single intensity measurement.
Polarisation effects appear when linearly polarized light interacts with a sample that has a magnetization component parallel to the light propagation direction k. Behind the sample the light polarisation plane is rotated and the polarisation has changed to elliptical. This effect has been observed in transmission (Faraday effect [1]) and recently in reflection (L-MOKE [2]). Both effects are even in the magnetization M allowing for investigations of ferromagnetic materials. Antiferromagnetic ordering can be probed by second order effects by applying a perpendicular orientation between k and M (Voigt effect [3]).
The applicability of these effects for the characterization of magnetic materials and devices is demonstrated with x-ray rotation and ellipticity spectra across the 3p and 2p edges of Mn, Fe, Co and Ni.
[1] J. Kunes et al., Phys. Rev. B 64, 174417 (2001)
[2] H.-Ch. Mertins et al., Phys. Rev. B, in press (2003)
[3] H.-Ch. Mertins et al., Phys. Rev. Lett. 87, 047401 (2001).