Berlin 2005 – wissenschaftliches Programm
Bereiche | Tage | Auswahl | Suche | Downloads | Hilfe
DS: Dünne Schichten
DS 24: Postersitzung II
DS 24.11: Poster
Dienstag, 8. März 2005, 17:00–19:00, Poster TU B
Applications of synchrotron infrared ellipsometry for analysis of small samples and heterogeneous films — •Michael Gensch1,2, Katy Roodenko1, Ullrich Schade3, Arnulf Röseler2, Ernst-Heiner Korte1, Karsten Hinrichs1, and Norbert Esser1 — 1ISAS - Institute for Analytical Sciences, Albert-Einstein-Str. 9, 12489 Berlin — 2GOS e.V., Rudower Chaussee 29, 12489 Berlin — 3BESSY, Albert-Einstein-Str. 15, 12489 Berlin
It was shown recently that the detection limits of infrared ellipsometry can be improved to monolayer sensitivity by use of appropriate measurement strategies and dedicated radiation sources such as synchrotron infrared beamlines [1]. Another question is if also biological or other samples with considerable spatial variations of the optical and chemical properties can be investigated with this method. The evaluation of the anisotropic optical constants [2] and of the structural parameters (e.g. molecular orientation) of such samples requires an understanding of the contributions due to deviations from the commonly applied layer models. This work shows that small and heterogeneous samples can be investigated with respect to thickness, structure and composition. It is outlined how different contributions such as roughness, varying thickness and chemical properties can be separated by applying the optical models, in particular if a highly brilliant source is used.
[1] M. Gensch, K. Hinrichs, U. Schade,A. Röseler, E.H. Korte, Anal. Bioanal. Chem. 376 (2003) 626. [2] K. Hinrichs, M. Gensch, K. Sahre, K.-J Eichhorn, N. Esser, U. Schade, A. Röseler, E.H. Korte, Appl. Spectrosc. 57 (2003) 1250.