Berlin 2005 – wissenschaftliches Programm
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MA: Magnetismus
MA 20: Poster:Schichten(1-29),Spintrsp(30-45),Ex-Bias(46-63),Spindyn(64-75),Mikromat.(76-80),Cluster(81-94),Abbv.(95-99),Obflm(100-02),SpElek.(103-09),E-Theo(110-14),Mikromag.(115-16),Spin+PÜ(117-26),Mag.Mat.(127-51),Meth.(152-55),Mol.Mag(156-59),Kondo(160-65
MA 20.53: Poster
Montag, 7. März 2005, 14:00–18:00, Poster TU C
Magnetic domain structure of micro-patterned PtMn/NiFe exchange bias bilayers — •K. Potzger1, L. Bischoff1, M. O. Liedke1,2, B. Hillebrands2, M. Rickart3, P. Freitas3, J. McCord4, and J. Fassbender1 — 1FZ Rossendorf, Institut für Ionenstrahlphysik und Materialforschung, 01314 Dresden — 2Fachbereich Physik, TU Kaiserslautern, 67663 Kaiserslautern — 3INESC MN, 1000 Lisabon, Portugal — 4IFW Dresden, Institut für Metallische Werkstoffe, 01069 Dresden
A bottom pinned exchange bias bilayer system consisting of 20 nm PtMn and 6 nm NiFe (produced using ion beam deposition (IBD) and physical vapour deposition (PVD, magnetron sputtering)) was laterally magnetic patterned by means of focused ion beam irradiation (FIB) on a micrometer scale. 25 keV ion irradiation with a fluence of 2 × 1014 Ga+ · cm−2 leads to a disordering of the as prepared chemically ordered PtMn-phase with only minor changes in sample topography. Thus the exchange bias field as well as the coercive field was reduced to a large extent on a local scale. The magnetic properties of FIB written 1 µ m wide stripes and their interaction with the non-irradiated spacing were analyzed by means of magneto-optic Kerr effect, magnetic force microscopy, and Kerr microscopy. The application of a magnetic field between -12 Oe and -80 Oe with respect to the exchange bias field direction leads to an antiparallel alignment of irradiated and non-irradiated stripes forming pronounced domain walls. A parallel alignment was found below -100 Oe and in the positive field region.