O 22: Rastersondentechniken I
Samstag, 5. März 2005, 10:45–13:00, TU EB407
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10:45 |
O 22.1 |
Long-range energy dissipation in non-contact AFM — •Domenique Weiner, André Schirmeisen, and Harald Fuchs
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11:00 |
O 22.2 |
Force-Distance studies by Atomic Force Microscopy using a Double Tuning Fork Sensor at Low Temperature — •Markus Heyde, Maria Kulawik, Hans-Peter Rust, and Hans-Joachim Freund
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11:15 |
O 22.3 |
Thermal atomic force microscopy in vacuum — •Martin Hinz, Bernd Gotsmann, Mark A. Lantz, Urs Dürig, Johannes Windeln, and Othmar Marti
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11:30 |
O 22.4 |
Capacitive force detection in dynamic mode Atomic Force Microscopy — •A.-D. Müller, F. Müller, T.D. Long, and M. Hietschold
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11:45 |
O 22.5 |
Scanning Ion Conductance Microscopy — •Tilman E. Schäffer, Pia Heidenreich, Matthias Böcker und Harald Fuchs
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12:00 |
O 22.6 |
Quantitative Measurement of Tip-Sample Forces by Dynamic Force Microscopy in Ambient Conditions — •Hendrik Hölscher, Jan-Erik Schmutz, Boris Anzcykowski, Marcus Schäfer, and Harald Fuchs
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12:15 |
O 22.7 |
Cantilever Sensors for Biomolecular Recognition — •Martin Bammerlin and Urs Hubler
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12:30 |
O 22.8 |
FM demodulated Kelvin probe force microscopy for surface photovoltage tracking — •Ulrich Zerweck, Christian Loppacher, Sebastian Teich, Tobias Otto, Elke Beyreuther, Stefan Grafström, and Lukas M. Eng
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12:45 |
O 22.9 |
Measurement of the near-field distribution of a wave guide with sub-wavelength aperture on a macroscopic scale — •Oliver Schimek, Georgios Ctistis, Jens J. Paggel, and Paul Fumagalli
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