Berlin 2005 – wissenschaftliches Programm
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O: Oberflächenphysik
O 28: Methodisches (Exp. und Theorie)
O 28.8: Vortrag
Samstag, 5. März 2005, 16:45–17:00, TU EB407
The Nanoworkbench: A Tool to Probe Electronic Properties of Surfaces and Small Structures — •Hubertus Marbach1,2,3,4, Olivier Guise1,2,3, Jeremy Levy2,5, Joachim Ahner2,6 und John T. Yates, Jr.1,2,3,5 — 1Surface Science Center — 2Center for Oxide Semiconductor Materials for Quantum Computation — 3Department of Chemistry — 4Lehrstuhl für Pysikalische Chemie II, Universität Erlangen-Nürnberg, Egerlandstraße 3, D-91058 Erlangen — 5Department of Physics, University of Pittsburgh, Pittsburgh, PA 15260 — 6Seagate Technology, Pittsburgh, PA 15222
To investigate the properties of surfaces and small particles in the sub-micrometer range we developed a novel experimental setup: the nanoworkbench (NWB). The core of the NWB consists of an array of four manipulators in UHV which can be positioned individually with nanometer precision. Equipped with sharp metal tips we can use the manipulators to contact the sample electrically. Four terminal measurements like van der Pauw or four-point probe measurements can be performed with the setup. Part of the design is an electron focusing column which enables us to image the sample and the four tips in situ by means of scanning electron microscopy. Running the nanomanipulators in scanning tunnelling microscopy mode provides an additional imaging method. The design of the NWB and first measurements will be presented. Work supported by AFOSR and DARPA