Berlin 2005 – wissenschaftliches Programm
Bereiche | Tage | Auswahl | Suche | Downloads | Hilfe
SYAM: Atomare Präzisionsmassenspektrometrie
SYAM 2: Atomare Pr
äzisionsmassenspektrometrie
SYAM 2.2: Hauptvortrag
Montag, 7. März 2005, 14:30–15:00, HU Senatssaal
A Precision Mass Balance Using Highly Charged Ions — •Reinhold Schuch1, Szilard Nagy1, Birgit Brandner1, Marcus Suhonen1, Tomas Fritioff2, Klaus Blaum2, and Ingmar Bergström3 — 1Atomic Physics Division, Stockholm University, AlbaNova, S-10691 Stockholm, Sweden, e-mail: schuch@physto.se — 2CERN, 1211 Geneva, Switzerland — 3Manne Siegbahn Laboratory(MSL), 104 05 Stockholm, Sweden
Precision mass measurements are done with the SMILETRAP Penning trap mass spectrometer, located at MSL in Stockholm. It exploits the merits of highly charged ions retrapped from an electron beam ion source. These ions are retarded in a first cylindrical Penning trap and a fraction of them is sent to the hyperbolic precision Penning trap. There it is possible to measure the cyclotron frequencies of such ions with 10-8 resolution [1] using the time-of-flight technique. The relevant observable in our mass measurement is the ratio of the cyclotron frequencies of the ion of interest and an ion used as a mass reference. In order to reduce the influence of changes to the magnetic field, both frequencies are measured within as short a time as two minutes. Several mass measurements with a relative uncertainty in the region of 0.3 to a few ppb have been performed, using ions with charge states 1+ to 52+[2]. The latest achievements will be reported.
[1] I. Bergström, C. Carlberg, T. Fritioff, G. Douysset, J. Schönfelder and R. Schuch, NIM A487, 618-651 (2002) [2] T. Fritioff, H. Bluhme, R. Schuch, I. Bergström and M. Björkhage, Nuclear Physics A, Volume 723, 3-12 (2003)