Dresden 2006 – wissenschaftliches Programm
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CPP: Chemische Physik und Polymerphysik
CPP 23: POSTER Functional Organic Thin Films
CPP 23.41: Poster
Donnerstag, 30. März 2006, 17:00–19:00, P2
Comparison of the SIMS and XPS depth profile of new and aged OLED structures — •Sebastian Scholz1, Karsten Walzer1, Steffen Oswald2, and Karl Leo1 — 1Institut für Angewandte Photophysik, TU Dresden, George-Bähr-Straße 1, 01069 Dresden — 2Leibniz-Institut für Festkörper- und Werkstoffforschung Dresden, Helmholtzstraße 20, 01069 Dresden
An important issue of current organic light emitting diodes (OLED) research is the understanding of degradation mechanisms and the improvement of device lifetime. In this work we study the migration and/or diffusion of several metals (in neutral or ionic state) through the OLED during lifetime measurements. We take a closer look to the contact materials Ag, Al, Au, Sn and In, and the behaviour of Cs, the doping material in the electron transport layer. Since these metals are expected to quench the radiative recombination in the emitting layers of OLEDs, they should not enter the emission zone at any time. For the analysis of the metal diffusion we performed depth profiling on new and aged OLEDs and test devices by secondary ion mass spectroscopy (SIMS) and X-ray photoemission spectroscopy (XPS) for the characterization of the organic and metallic layers.