Dresden 2006 – wissenschaftliches Programm
Bereiche | Tage | Auswahl | Suche | Downloads | Hilfe
DS: Dünne Schichten
DS 10: Thin organic films I
DS 10.4: Vortrag
Dienstag, 28. März 2006, 10:15–10:30, GER 38
Molecular Orientation of ZnPc grown on Silicon(111) Substrates and its Influence on the Optical Constants. — •Sindu John Louis1, Daniel Lehmann1, Katy Roodenko2, Karsten Hinrichs2, Norbert Esser2, Marion Friedrich1, and Dietrich R. T. Zahn1 — 1Chemnitz University of Technology, Semiconductor Physics, D-09107 Chemnitz, Germany — 2ISAS - Institute for Analytical Sciences, Department Berlin, Albert-Einstein-Straße 9, 12489 Berlin, Germany.
To improve the electronic properties of opto-electronic devices, the molecular stacking and the optical constants of the organic compounds are of great interest. Thin films of ZnPc were prepared by Organic Molecular Beam Deposition (OMBD) on silicon substrates. Variable Angle Spectroscopic Ellipsometry (VASE) measurements in the infrared, visible and ultraviolet regions and infrared (IR) reflection measurements were used to study the samples.
From the ellipsometry data evaluation the film thickness, surface roughness and the ZnPc optical constants were determined. These optical constants depend strongly on the method of preparation. Together with the evaluation of infrared reflection spectra and of transmission spectra of KBr pellets with ZnPc powder these results show that the films are optically anisotropic. The results are used to extract the average molecular tilt angle and to generate optical constants and spectra for isotropic films and for films of molecules which are oriented perpendicular and parallel to the substrate surface.