Dresden 2006 – wissenschaftliches Programm
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DS: Dünne Schichten
DS 24: Poster presentation
DS 24.34: Poster
Dienstag, 28. März 2006, 15:00–17:30, P2
Preparation of TEM cross-sections and HRTEM structure determination of thin La0.7Sr0.3MnO3 films — •Thomas Riedl, Thomas Gemming, and Klaus Wetzig — IFW Dresden, P.O. Box 270116, D-01171 Dresden, Germany
For the determination of lattice distortions of crystalline films by means of HRTEM well prepared TEM specimens are required. The quality of specimen preparation can be quantified in terms of amorphization, impurity content and specimen morphology. Conventional preparation using ion milling as well as the focussed ion beam H-bar technique have been applied to produce cross-sections of La0.7Sr0.3MnO3 /SrTiO3 samples interesting for magnetoelectronics. Thickness maps near the specimen rim indicate that under the applied parameters particularly the Bal-Tec RES ion mill produces large thin areas with small wedge angles and bending. Low-energy milling at 0.5keV reduces amorphized rims below 1nm leading to an enhanced atomic-column contrast in HRTEM images. The lattice distortions within the La0.7Sr0.3MnO3 films have been studied by the analysis of HRTEM geometric phase [1]. As expected the lattice planes perpendicular to the interface are expanded whereas the parallel planes are compressed relative to the bulk [2].
[1] M. J. Hytch et al.: Ultramicr. 74 (1998) 131
[2] We acknowledge the DFG for financial support via FOR 520, project GE 1037/8.