Dresden 2006 – wissenschaftliches Programm
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DS: Dünne Schichten
DS 24: Poster presentation
DS 24.53: Poster
Dienstag, 28. März 2006, 15:00–17:30, P2
Effect of the Base Pressure on OMBD grown BCP Layers Studied by Spectroscopic Ellipsometry — •Daniel Lehmann and Dietrich R. T. Zahn — Chemnitz University of Technology, Semiconductor Physics, D-09107 Chemnitz, Germany
Bathocuproine (BCP) layers are used in organic opto-electronic devices such as organic light emitting devices (OLEDs) and organic photovoltaic (OPV) solar cells as electron conducting, exciton blocking layers enhancing the device efficiency. The layers in this study were grown using Organic Molecular Beam Deposition (OMBD) on cleaned silicon substrates with a layer of natural silicon oxide. Two layers with different thicknesses (10 nm and 100 nm) were prepared for each base pressure step. After preparation they were studied ex situ with Variable Angle Spectroscopic Ellipsometry (VASE) in the energy range from 0.73 eV to 5.00 eV and the dielectric functions were determined. The results show that the base pressure, ranging from 10−5 mbar to 10−8 mbar has a strong impact on the dielectric function and therefore also on light absorption and refraction.