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DS: Dünne Schichten

DS 6: Thin film analysis III

DS 6.4: Talk

Monday, March 27, 2006, 15:15–15:30, GER 38

Characterization of nanostructures by conducting AFM — •Andrei Andreev, Yue Hou, and Christian Teichert — Institute of Physics, University of Leoben, Franz-Josef-Str. 18, A-8700 Leoben, Austria

The Conducting Atomic-Force Microscope (C-AFM) is a conventional AFM working in contact mode, where the usual AFM tip is replaced by a conductive tip. Between the tip and the sample a voltage is applied and the resulting current is measured using a special amplification circuit. The C-AFM is well known as a valuable tool for nanometer scale characterization of electric and topographic properties of very thin oxide layers [1,2].

In this work, we focus on the capabilities of C-AFM technique for spatially resolved investigations of various nanostructures like hybrid organic-inorganic structures, metallic nanowires or light emitting organic nanofibers. Here, the applicability of C-AFM, in particular of two-dimensional current mapping, for the characterization of such nanostructures is presented.

[1] S. Kremmer, et al., Mat. Sci. Eng. B102 (2003), 88

[2] S. Kremmer, et al., J. Appl. Phys. 97 (2005), 074315