Dresden 2006 – wissenschaftliches Programm
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MA: Magnetismus
MA 29: Magnetic Thin Films IV
MA 29.8: Vortrag
Donnerstag, 30. März 2006, 17:00–17:15, HSZ 03
Comparison of sputter-techniques for Co/Pt-multilayer-growth — •H. Stillrich1, S. Pütter1, D. Lott2, R. Frömter1, A. Schreyer2, and H.P. Oepen1 — 1Institut für Angewandte Physik, Universität Hamburg, Jungiusstr. 11, 20355 Hamburg, Germany — 2GKSS-Forschungszentrum Geesthacht, Institut für Werkstoffforschung, Max-Planck-Str., 21502 Geesthacht, Germany
Co/Pt-Multilayers are well known to show high perpendicular magnetic anisotropy (PMA) and magneto-optic response. Therefore there has been great interest in this system over the last decades. In general these films are grown either by MBE or by magnetron sputtering.
In the work presented here ECR-sputtering was used as growth process to guarantee kinetic growth conditions. The films reported in this study show high quality Pt(111)-texture which is crucial for high perpendicular surface anisotropies. The films show PMA for Pt-buffer-layers as thin as 4 nm and Co-layers from 0.4 to 0.7 nm.
We have investigated the magnetic, magneto-optic and structural properties from single Co-layers to Co-multilayers. The magnetic properties are studied by magneto-optic Kerr effect (MOKE) and scanning electron microscopy with polarization analysis (SEMPA). Structural analysis was carried out by x-ray diffraction and reflectometry. The films grown by ECR-sputtering show interface intermixing and the surface anisotropy is reduced compared to MBE or magnetron sputtered films. For comparison we have also grown Co/Pt-films by magnetron sputtering. The influence of the growth technique on film properties is discussed.