Dresden 2006 – wissenschaftliches Programm

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MM: Metall- und Materialphysik

MM 25: Poster Session

MM 25.25: Poster

Mittwoch, 29. März 2006, 15:30–17:30, P4

Advanced Materials Analysis using the Field Ion Image Tomography — •Alexander Heinrich, Catharina Wille, Talaat Al-Kassab, and Reiner Kirchheim — Institut für Materialphysik, Friedrich-Hund-Platz 1, 37077 Göttingen, Germany

The newly developed Field Ion Image Tomography is an excellent method which combines atomic resolution with a comparably large analysis volume in the order of 200nmx200nmx200nm. Due to the absence of cyclic stress with respect to the field assisted evaporation sequence of surface atoms during a Tomographic Atom Probe (TAP) analysis, specimen stability is improved and analysis of brittle materials is possible. The authors will introduce this new technique and give recent examples which demonstrate the capability of Field Ion Image Tomography. In particular, unique results on the thermal stability of nanocrystalline materials with respect to grain size and orientation and on the decomposition of CuCo, showing a long-scale arrangement of precipitates in phase decomposition due to the influence of elastic strain, will be introduced.