Dresden 2006 – wissenschaftliches Programm
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O: Oberflächenphysik
O 6: Scanning probe techniques I
O 6.6: Vortrag
Montag, 27. März 2006, 12:30–12:45, WIL B321
Video-rate Scanning Probe Microscopes: solving the problem of resonances induced by the non-linear piezo material. — •G.J.C. van Baarle1,2, W.M. van Spengen1, W.A. van Loo1, R. Schakel1, L. Crama1, J.W.M. Fenken1, M.J. Rost1,2, and T.H Oosterkamp1 — 1Kamerlingh Onnes Laboratory, Leiden University, P.O. box 9504, 2300 RA Leiden, The Netherlands — 2Leiden Probe Microscopy BV, P.O. box 9504, 2300 RA Leiden, The Netherlands
For a wide variety of surface and interface phenomena in both fundamental and applied contexts, it is becoming increasingly important to visualize them with atomic or molecular resolution combined with high speeds. We report on the recent progress we made in the development of fast scanning probe techniques, and demonstrate that the current bottleneck for fast imaging is given by the mechanical properties of the scanner rather than the control electronics. This has been confirmed by testing several home-built and commercial instruments. In order to optimize the scanners for high speeds, we take into account the influences of piezo non-linearity. We present experimental results showing the existence of both non-linear super- and subharmonic resonances. In addition, we also consider the strength of the non-linear effects as a function of piezo geometry. Preliminary results indicate that the above problems can be circumvented by actuating the piezo scanner with the well-known, but in the context of SPM technology not commonly used, ’charge control’ technique instead of the more standard method of ’voltage control’.