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TT: Tiefe Temperaturen
TT 24: Superconductivity: Cryodetectors
TT 24.6: Talk
Wednesday, March 29, 2006, 18:00–18:15, HSZ 02
3D-scanning microscopy for microwave frequencies with Josephson cantilevers — •Andre Kaestner, Felix Stewing, and Meinhard Schilling — Institut für Elektrische Messtechnik und Grundlagen der Elektrotechnik, TU Braunschweig, Hans-Sommer-Straße 66, 38106 Braunschweig
In recent semiconductor communication technology frequencies between a few GHz up to 100 GHz are employed. In the future much higher frequencies up to the THz regime are in reach. Therefore we develop a new method for measuring the near-field radiation of a microwave source with small dimensions. We use a scanning microscope equipped with a Josephson junction on a cantilever to measure a near-field power distribution in three dimensions around a microwave chip.
To detect the microwave radiation we use Josephson junctions sensitive to frequencies between several GHz to a few THz. The Josephson junctions are made of the high-temperature superconductor YBa2Cu3O7 on LaAlO3 bicrystal substrates. The 3D-positioning stage of the scanning microscope system allows us to measure the power distribution in a volume of 15x15x15 mm3 with a spatial resolution of 100 nm. For demonstration first results for the power distribution of a 98 GHz source are presented.