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A: Fachverband Atomphysik

A 10: Poster I - Precisions Spectroscopy

A 10.7: Poster

Dienstag, 20. März 2007, 16:30–18:30, Poster B

Resonance Laser Spectroscopy on Trapped Highly-Charged Ions using Soft X-rays from FLASH — Sascha Epp, •Jose Crespo Lopez-Urrutia, and Joachim Ullrich — Max-Planck-Institut fuer Kernphysik, Saupfercheckweg 1, D-69117 Heidelberg

Resonance laser spectroscopy, the most sensitive tool for atomic structure studies, has been severely limited due to the lack of appropriate light sources beyond the UV and especially the VUV region. With the free electron laser in Hamburg, FLASH, the soft x-ray region is now widely opened to laser spectroscopy and heavy, few-electron systems -i.e. highly charged ions (HCI) - are now accessible by this precision method. The transition between the 2S1/2 (ground) and 2P1/2 (excited) states was investigated for Li-like iron Fe23+ ions by matching soft x-rays from FLASH together with HCI provided in a transportable EBIT. The present statistical accuracy is already superior to the theoretical uncertainties and allows verifying the leading two-photon QED terms.