Regensburg 2007 – wissenschaftliches Programm

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DS: Fachverband Dünne Schichten

DS 15: Poster Session

DS 15.22: Poster

Dienstag, 27. März 2007, 15:00–17:00, Poster B

In-situ surface sensitive X-ray investigations of quench condensed thin metal films — •Christian Markert, Dirk Lützenkirchen-Hecht, Sascha Gertz, and Ronald Frahm — Bergische Universität Wuppertal, Fachbereich C / Abteilung Physik, Gaußstraße 20, 42119 Wuppertal

We report of ultrahigh vacuum (UHV) experiments on ultra thin Au, Bi and Pb films (thickness less than 10 nm) deposited on atomically flat float-glass substrates which are held at cryogenic temperatures down to 10 K. For deposition temperatures below 100 K the formation of highly disordered or even amorphous metal films can be expected, because thermally activated diffusion of the ad atoms should be inhibited. An UHV chamber was constructed which is suited for grazing incidence X-ray experiments during the quench condensation of the metal films. Various X-ray methods were used for the in-situ investigation of the films growth and their structural evolution with the thickness and an subsequent annealing process. EXAFS (Extended X-ray Absorption Fine Structure) in reflection is used to study the local structure of the films. Furthermore specular and non-specular X-ray reflectivity measurements were performed to get information about the films density and surface roughness parameters (correlation length, hurst parameter etc.). In addition in situ resistivity measurements which are sensitive towards changes of the films microstructure were performed in parallel to the X-ray experiments.