Regensburg 2007 – wissenschaftliches Programm
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MM: Fachverband Metall- und Materialphysik
MM 22: SYM Physics meets Industry
MM 22.10: Vortrag
Mittwoch, 28. März 2007, 18:15–18:35, H16
Quantitative elastic modulus measurement at the nanoscale using atomic force microscope — •Udo Volz3, Sergey Belikov1, Sergei Magonov1, Natalia Erina1, Lin Huang1, Craig Prater1, Valeriy Ginzburg2, Gregory Meyers2, Robert McIntyre2, and Hamed Lakrout2 — 1Veeco Instruments Inc., 112 Robin Hill Road, Santa Barbara, CA 93117, USA — 2Dow Chemical Company, Analytical Sciences 1897E Building, Midland, MI 48667, USA — 3Veeco Instruments GmbH, Dynamostrasse 19, D-68165 Mannheim, Germany
Quantitative studies of the elastic modulus of homogeneous polymer materials in a wide modulus range and recognition of the individual components and the interphases in heterogeneous systems with the AFM-based cantilever nanoindentation method will be presented.