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MM: Fachverband Metall- und Materialphysik

MM 22: SYM Physics meets Industry

MM 22.2: Talk

Wednesday, March 28, 2007, 15:05–15:25, H16

New Possibilities for X-ray Diffractometry — •Jörg Wiesmann, Christian Hoffmann, Jürgen Graf, and Carsten Michaelsen — Incoatec GmbH, Max-Planck-Str. 2, 21502 Geesthacht

During the last years the instrumentation for X-ray metrology has remarkably improved. There are numerous solutions for all components such as sources, optics and detectors. We present a new development for X-ray beams which we deliver in modules custom-built: the IµS - Incoatec Microfocus Source - is a high-brilliance X-ray source incorporating a 30W microfocus sealed tube together with a high-performance Montel Multilayer X-ray Optic. The IµS has the brilliance of a conventional 5.4-kW rotating anode system, but offers numerous benefits for example no moving parts, long lifetime without maintenance, air-cooling to name but a few. It can be integrated into various X-ray analytical systems using Cu or Mo radiation. The optics shape parallel as well as focused beams with different spot sizes. Data quality and ease of operation are strongly improved in applications such as biological and chemical crystallography and Small Angle X-ray Scattering (SAXS). For SAXS there is a factor of five intensity gain compared to a conventional sealed-tube setup. Finally we will give an outlook on further improvements of IµS. We invite users to discuss their requirements and share their ideas with us.