Regensburg 2007 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 17: Poster Session I (Nanostructures at Surfaces; Metal Substrates: Epitaxy and Growth; Methods: Scanning Probe Techniques; Phase Transitions)
O 17.41: Poster
Montag, 26. März 2007, 17:30–20:30, Poster C
Measuring the Anisotropy of Atomic-Scale-Friction by Friction Force Microscopy — •Peter Köchling1,2, Markus Schäfer1,2, Jan-Erik Schmutz1,2, and Hendrik Hölscher1,2 — 1Physikalisches Institut, Westfälische Wilhelms Universität Münster, Wilhelm-Klemm-Str.10, 48149 Münster, Germany — 2CeNTech (Center for Nanotechnology), Heisenbergstr. 11, 48149 Münster, Germany
Friction anisotropy is defined as the dependence of friction on the relative orientation of two sliding surfaces. This fundamental tribological phenomenon is of high interest for the analysis of the origin of atomic scale friction [1-3].
In order to investigate the friction anisotropy between a Si-tip and different sample surfaces we included a rotation stage into a commercial Friction Force Microscope (FFM). In this way we are able to control the orientations between tip and sample without the limitation to specific samples [1,3] or sensors [2].
Using this experimental set-up we measured frictional properties like adhesion and friction coefficients in dependence of the sample orientation. We will compare these results with theoretical predictions and published experiments.
[1] Liley et al. Science 280, 273 (1998)
[2] Dienwiebel et al. Phys. Rev. Lett. 92, 126101 (2004)
[3] Park et al. Science 309, 1354 (2005)