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O: Fachverband Oberflächenphysik

O 60: Time-Resolved Spectroscopies

O 60.11: Talk

Thursday, March 29, 2007, 18:15–18:30, H42

A soft x-ray energy-dispersive beamline for NEXAFS and other CFS/CIS studies — •D. R. Batchelor¹, Th. Schmidt¹, R. Follath², Ch. Jung², R. Fink³, M. Knupfer⁴, B. Büchner⁴, and E. Umbach¹ — ¹Universität Würzburg, Experimentelle Physik II — ²BESSY GmbH, Berlin — ³Physikalische Chemie II, Universität Erlangen-Nürnberg — ⁴IFW Dresden

Energy-dispersive near edge x-ray absorption fine structure (NEXAFS) spectroscopy is a well-known technique in the hard x-ray regime. By combining the photon energy dispersion of a plane-grating XUV monochromator with the imaging properties of a hemispherical electron energy analyzer, soft x-ray energy dispersive electron spectroscopy is possible. This multiplex technique allows not only NEXAFS without time-consuming scanning of the photon energy but also high-resolution CFS/CIS spectroscopic studies such as Auger/autoionization spectroscopy and photoelectron diffraction. We present the design for an upgrade of the BESSY UE52-PGM beamline and the results of a pilot experiment. Data from copper and its oxides together with phthalocyanines will be presented. Besides the common photoemission and Auger lines and the known participator and spectator decay channels the extensive, quasi-3-dimensional data sets clearly show that other excitations, such as “shake-up”, play an important role in both, the normal and resonant Auger processes. The new technique provides data with much more accuracy and detail than hitherto achieved by simply stepping the photon energy.
Financial support is under BMBF 05KS4WWC/2