Regensburg 2007 – wissenschaftliches Programm

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TT: Fachverband Tiefe Temperaturen

TT 4: Solids at Low Temperature - Materials

TT 4.1: Vortrag

Montag, 26. März 2007, 11:30–11:45, H18

The ADRESS project at the Swiss Light Source: A beamline for RIXS and ARPES studies on correlated and nanostructured materials — •Thorsten Schmitt¹, Vladimir Strocov¹, Thomas Schmidt¹, Uwe Flechsig¹, Juraj Krempaski¹, Giacomo Ghiringhelli², Claudia Dallera², Lucio Braicovich², Marco Grioni³, and Luc Patthey¹ — ¹Paul Scherrer Institut, Villigen PSI, Switzerland — ²Politecnico di Milano, Italy — ³EPFL, Switzerland

Resonant inelastic X-ray scattering (RIXS) is a powerful bulk-sensitive probe of the electronic structure of condensed matter with atomic and orbital sensitivity. Soft X-Ray Angle-Resolved Photoelectron Spectroscopy (ARPES) allows k-resolved investigations of the electronic structure and correlation effects with enhanced bulk sensitivity. New instrumentation for both, RIXS and Soft X-Ray ARPES, will become available at the ADvanced RESonant Spectroscopies (ADRESS) beamline at the Swiss Light Source (SLS) beginning from spring 2007. We report on construction and planned capabilities of the ADRESS beamline, following an optical scheme with a plane grating monochromator. The ADRESS beamline will deliver soft X-rays with variable polarization (circular and linear) between 0.4 and 1.8 keV at high resolving power of ~28000 near 1 keV. The undulator for this beamline adopts an Apple-type scheme with 4 arrays of permanent magnets with a fixed magnetic gap. The RIXS end-station with an ultra-high resolution soft X-ray spectrometer (resolving power ~12000 around 1 keV) will be installed on a rotating platform in order to study low-energy excitations as a function of momentum transfer.