DPG Phi
Verhandlungen
Verhandlungen
DPG

Berlin 2008 – scientific programme

Parts | Days | Selection | Search | Downloads | Help

DS: Fachverband Dünne Schichten

DS 17: Poster: Trends in Ion Beam Technology, Magnetism in Thin Films, Functional Oxides, High-k Dielectric Materials, Semiconductor Nanophotonics, Nanoengineered Thin Films, Layer Deposition Processes, Layer Growth, Layer Properties, Thin Film Characterisation, Metal and Amorphous Layers, Application of Thin Films

DS 17.35: Poster

Tuesday, February 26, 2008, 09:30–13:30, Poster A

INFRARED ELLIPSOMETRY STUDY OF LaNiO3/LaAlO3 SUPERLATTICES — •Y. Matiks, A.V. Boris, P. Popovich, H.-J. Kim, G. Cristiani, H.-U. Habermeier, and B. Keimer — Max-Planck-Institut für Festkörperforschung, Heisenbergstr. 1, 70569 Stuttgart

The far-IR variable angle spectroscopic ellipsometry, as a power optical technique for the investigation of the dielectric properties of thin films, was used to study electrodynamics of LaNiO3/LaAlO3 superlattices. These superlattices with different individual layer thickness and number of interfaces were deposited on SrTiO3, LaSrGaO4, LaSrAlO4 substrates by pulsed laser deposition.

We found that an increasing of substrate lattice parameter and a decreasing of individual layer thickness induce the decreasing of the charge carrier density. A decreasing of the thickness of layer to one unit cell leads to the insulator-metal transition in (LaNiO3)n/(LaAlO3)n superlattices on SrTiO3 substrate. This metal-insulator transition may be induced by two factors: 1) localization of the electrons in the context of orbital reconstruction at the interfaces; 2) granulating of layers with the thickness close to one unit cell due to the roughness of substrates.

100% | Mobile Layout | Deutsche Version | Contact/Imprint/Privacy
DPG-Physik > DPG-Verhandlungen > 2008 > Berlin