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DS: Fachverband Dünne Schichten
DS 20: Organic Polymer-Metal Interfaces (SYSA 7)
DS 20.6: Talk
Wednesday, February 27, 2008, 19:15–19:30, H 2013
In-Situ Investigations of Si/Polypyrrole Interfaces by Pulsed Photoluminescence and IR Spectroscopic Ellipsometry — •Carl Matthias Intelmann1, Vitali Syritski2, Karsten Hinrichs3, and Jörg Rappich1 — 1Hahn-Meitner-Institut Berlin GmbH, Department Silicon Photovoltaics (SE1), Berlin, Germany — 2Tallinn University of Technology, Department of Materials Science, Tallinn, Estonia — 3ISAS - Institute for Analytical Sciences, Department Berlin, Germany
Conducting polymers - such as polypyrrole (PPy) - offer a unique combination of properties, which are interesting for photovoltaic applications. Important - especially - for solar cells is a low recombination rate of charge carriers at the silicon interfaces, which can be inspected by the band gap related photoluminescence (PL). We used pulsed PL techniques to investigate the recombination behaviour at the Si/PPy interface. The PPy films were directly deposited on Si substrates by electrochemical methods.
Our ex-situ and in-situ PL investigations show that PPy films on Si surfaces lead to well passivated Si interfaces. Ex-situ infrared spectroscopic ellipsometry (IR-SE) measurements yielded a thickness of approx. 45 nm of the ultrathin PPy films. Additionally performed in-situ IR-SE measurements show negligible formation of SiOx species at the Si/PPy interface.