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TT: Fachverband Tiefe Temperaturen

TT 3: Transport: Fluctuations and Noise

TT 3.1: Talk

Monday, February 25, 2008, 09:30–09:45, H 2053

Joint counting statistics of voltage and current — •Heidi Förster¹, Peter Samuelsson², and Markus Büttiker¹ — ¹University of Geneva, Switzerland — ²Lund University, Sweden

Current through a conductor can be characterized by the statistics of transferred charge. Of importance are also internal properties like fluctuations of charge inside the coherent conductor, these quantities can be investigated using voltage and dephasing probes. We determine the joint distribution of charge transferred into contacts and voltage at a voltage probe and compare it with the joint distribution of transferred charge and average occupation number at a dephasing probe. Of particular interest is the manifestation of which path information in the current-voltage correlations in interferometers.

[1] H. Förster, P. Samuelsson, and M. Büttiker, New J. Phys. 9, 117 (2007).

[2] H. Förster, P. Samuelsson, S. Pilgram, and M. Büttiker, Phys. Rev. B 75, 035340 (2007).

[3] S. Pilgram, P. Samuelsson, H. Förster, and M. Büttiker, Phys. Rev. Lett. 97, 066801 (2006).