Dresden 2009 – wissenschaftliches Programm

Bereiche | Tage | Auswahl | Suche | Downloads | Hilfe

CPP: Fachverband Chemische Physik und Polymerphysik

CPP 8: Nanoparticles I

CPP 8.4: Vortrag

Montag, 23. März 2009, 11:15–11:30, ZEU 114

Nanoscale Characterization of Single Metal Nanoparticles by their Scattering Patterns — •Tina Züchner¹, Frank Wackenhut¹, Antonio Virgilio Failla^1,2, and Alfred J. Meixner¹ — ¹Eberhard-Karls-Universität Tübingen, Institute of Physical and Theoretical Chemistry, Tübingen, Germany — ²University of Cambridge, The Cancer Research UK, Cambridge, UK

We present a novel route to detect the environment of metal nanoparticles by means of confocal interference scattering microscopy in combination with higher order laser modes. Each scattering pattern results as the sum of the light reflected at the interface between two dielectric media and the light scattered by the particles. The images not only show directly the orientation of individual Au nanorods [1-3], but are also extremely sensitive on variations of the local environment [4]. In fact, changing the refractive index of the surrounding medium strongly influences e.g. the signal to noise ratio, the amplitude and the contrast sign which in addition reveals the nature of the interface between two dielectric media. A quantitative understanding of the refractive index's influence on the scattering pattern was achieved by comparing the experimental results and our theoretical calculations.

[1] A.V. Failla, H. Qian, H. Qian, A. Hartschuh and A.J. Meixner, Nano Lett. 6, 1374 (2006). [2] A.V. Failla, S. Jäger, T. Züchner, M. Steiner and A.J. Meixner, Opt. Expr. 15, 8532 (2007). [3] T. Züchner, A.V. Failla, A. Hartschuh and A.J. Meixner, J. Microsc. 229, 337 (2008). [4] T. Züchner, A.V. Failla, M. Steiner and A.J. Meixner, Opt. Expr. 16, 14635 (2008).