Dresden 2009 – wissenschaftliches Programm
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DS: Fachverband Dünne Schichten
DS 2: Thin Film Characterisation: Structure Analyse and Composition (XRD, TEM, XPS, SIMS, RBS, ...) II
DS 2.2: Vortrag
Montag, 23. März 2009, 14:15–14:30, GER 37
Texture analysis on the system Mn4Si7@Si(001): Combining statistical and microscopical information — •Herbert Schletter1, Steffen Schulze1, Michael Hietschold1, Koen De Keyser2, Christophe Detavernier2, Gunter Beddies1, and Meiken Falke1,3 — 1Institute of Physics, University of Technology, 09107 Chemnitz, Germany — 2Department of Solid State Physics, Ghent University, Belgium 9000 — 3at present Bruker AXS, Germany
Higher manganese silicides (HMS) are promising candidates for opto- and thermoelectrical applications. They are stable, environmentally friendly and cheap. Since these materials show a strong anisotropy in their electrical properties, it is important to know the texture of HMS thin films on silicon. The system Mn4Si7@Si(001) was investigated with electron backscatter diffraction (EBSD) to reveal both, statistical information on crystallite orientation (i.e. texture) and microscopical information on crystallite sizes.
Besides the known epitaxial orientations of this system, new texture components were found, including epitaxial and axiotaxial relations. The latter component (which can be described as an off-normal fibre texture) is of special interest since it has been known for only few years and has been investigated on a small number of materials up to now.
By combining the statistical and microscopical information provided by EBSD, a correlation between the respective texture components and the grain size could be drawn, which showed, that the degree of periodicity at the interface strongly influences the size of the growing crystallite.