Dresden 2009 – wissenschaftliches Programm
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DS: Fachverband Dünne Schichten
DS 24: Organic Thin Films IV
DS 24.4: Vortrag
Mittwoch, 25. März 2009, 17:15–17:30, GER 38
The morphology and optical properties of CuPc thin films on passivated Si(111) — •Li Ding1, Falko Seidel1, Mario Zerson2, Cameliu Himcinschi1, Marion Friedrich1, and Dietrich R. T. Zahn1 — 1Semiconductor Physics, Chemnitz University of Technology, D-09107 Chemnitz, Germany — 2Chemistry Physics, Chemnitz University of Technology, D-09107 Chemnitz, Germany
Phthalocyanines (Pcs), chemically and thermally stable p-type organic semiconductors, are of great importance as promising materials for optical and electrical devices [1-2]. They show strong visible and UV absorption, which can be tuned e.g. by different central metal ions. Copper phthalocyanine (CuPc), one of the most intensively studied metal phthalocyanines, is deposited onto H-passivated Si(111) wafers with different offcut angles by organic molecular beam deposition (OMBD) under ultra-high vacuum (UHV) condition. The morphology of Si(111) surfaces passivated in HF of different concentrations is investigated by atomic force microscopy (AFM) before and after CuPc deposition. Variable angle spectroscopic ellipsometry (VASE) and reflectance anisotropy spectroscopy (RAS) are employed to study optical properties of CuPc thin films and their dependence on substrate surface roughness and offcut angles.
Reference
[1] N. B. McKeown, Phthalocyanine Materials, Synthesis, Structure and Function, Cambridge University Press, Cambridge, 1998.
[2] J. Simon, J. J. Andre, Molecular Semiconductors, Springer Verlag, Berlin, 1985