Dresden 2009 – wissenschaftliches Programm

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DS: Fachverband Dünne Schichten

DS 26: Poster II

DS 26.38: Poster

Mittwoch, 25. März 2009, 09:30–12:30, P5

New microfocus source for X-ray diffractometry of thin films and nano-sized materials — •Jörg Wiesmann, Steffen Kroth, Bernd Hasse, and Carsten Michaelsen — Incoatec GmbH, Max-Planck-Strasse 2, 21502 Geesthacht

The increasing importance of X-ray diffractometry with 2-dimensional detectors for materials research has lead to a rising demand for highly intense X-ray sources enabling the analysis of small, weakly scattering samples in the home-lab. Therefore, various microfocusing sealed tube X-ray sources with focal spot sizes below 100μm are available. We present the new high-brilliance microfocus source IμS. The source incorporates a combination of an extremely bright stationary air-cooled 30 W microfocus source and the newest type of 2-dim beam shaping multilayer optics, the so called Quazar optics. Measurements of thin films and nanosized materials demonstrate the possibilities of new microfocus solutions for XRD. The comparison of IμS with typical sealed tube systems shows data of outstanding quality. Especially for measurements of powders in transmission geometry the IμS delivers very promising results. For small angle scattering a factor of 5 in comparison to a typical sealed tube instrument was observed when using an IμS with optics for a parallel beam.