Dresden 2009 – wissenschaftliches Programm
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MA: Fachverband Magnetismus
MA 40: Poster II: Bio- and Molecular Magnetism (1-9); Magnetic Coupling Phenomena/Exchange Bias (10-15); Magnetic Particlicles and Clusters (16-29); Micro and Nanostructured Magnetic Materials (30-51); Multiferroics (52-64); Spin Injection in Heterostructures (65-67); Spin-Dyn./Spin-Torque (68-93); Spindependent Transport (94-108)
MA 40.13: Poster
Freitag, 27. März 2009, 11:00–14:00, P1A
Comparison of the behaviour of Magnetic Force Microscopy tips in measurements in external in-plane magnetic fields — •Christoph Schmidt1, Tanja Weis1, Dieter Engel1, Arno Ehresmann1, Volker Hoeink2, Jan Schmalhorst2, and Guenter Reiss2 — 1Department of Physics and Center for Interdisciplinary Nanostructure Science and Technology (CINSaT), University of Kassel, Heinrich-Plett-Str. 40, 34132 Kassel, Germany — 2University of Bielefeld, Department of Physics, Nano Device Group, P.O. Box 100131, 33501 Bielefeld, Germany
Magnetic Force Microscopy (MFM) measurements in external in-plane magnetic fields are influenced by the undesired effect of the field on the magnetic moment of the tip. A simple approach is to use the point dipole approximation and consider this effect as a tilt of the tip's magnetic dipole moment. By measuring a topographically flat calibration sample with an artificially created periodic magnetic pattern, stable in a certain external magnetic field range this tilt can be determined [1]. The fabrication procedure of ion bombardment induced magnetic patterning (IBMP) for such calibration samples and results of the calibration of two different kinds of commercial MFM tips will be discussed.