Dresden 2009 – wissenschaftliches Programm

Bereiche | Tage | Auswahl | Suche | Downloads | Hilfe

MM: Fachverband Metall- und Materialphysik

MM 22: Topical Session Nanoanalytics using Small-Angle Scattering - Poster

MM 22.2: Poster

Dienstag, 24. März 2009, 14:45–16:30, P4

Extending the possibilities of a Kratky-Compact-Camera by use of focussing multilayer X-ray optics — Thomas Henze, •Albrecht Petzold, Klaus Schröter, and Thomas Thurn-Albrecht — Institut für Physik, Martin-Luther-Universität Halle-Wittenberg, 06099 Halle, Germany

The use of focussing multilayer x-ray optics on laboratory x-ray equipment offers the potential of a substantial gain in primary beam intensity without a significant loss of resolution. We present the result of a refurbishment of Kratky-Compact-Camera, a classical setup for small angle x-ray scattering on isotropic samples, with an elliptically bent focussing multilayer. The advantages of the Kratky collimation system are ease of alignment, high intensity and low background. A further gain in intensity is highly desirable for time dependent experiments as well as for measurement of weakly scattering samples. The performance of the revised setup is analyzed quantitatively by comparing intensity and full width at half maximum of the primary beam, as well as the minimal accessible scattering vector with the corresponding parameters of the simple setup without optics. A gain in intensity of a factor 2 up to 10 is achieved, depending on the details of the alignment. In addition the multilayer produces a monochromatic beam. First measurements on expemplary polymer systems are shown.