Dresden 2009 – wissenschaftliches Programm
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MM: Fachverband Metall- und Materialphysik
MM 35: Poster Session II
MM 35.20: Poster
Mittwoch, 25. März 2009, 16:30–18:30, P4
Transmission electron microscopy study of the interface Pr1−xCaxMnO3 / YBa2Cu3O7−d — •Jonas Norpoth1, Thilo Kramer1, Christian Jooss1, Hiromi Inada2, and Yimei Zhu2 — 1Institut für Materialphysik, Universität Göttingen — 2Institute for Advanced Electron Microscopy, Brookhaven National Laboratory
Interfaces between highly correlated electron systems may exhibit novel electronic properties that are absent in the isolated materials. Especially, complex oxide interfaces often feature nontrivial electronic behaviour, the understanding of which needs a careful analysis of the relation between interface structure and electronic properties at the atomic scale. In this work we study the interface between the high-Tc superconductor YBa2Cu3O7−d and the hole-doped perovskite Pr1−xCaxMnO3. Thin film multilayers fabricated with pulsed laser deposition on epitaxial substrates exhibit atomically sharp interfaces as was demonstrated by high-resolution transmission electron microscopy. Electron energy loss spectroscopy indicates electron transfer across the interface from PCMO to YBCO according to a band bending scenario from the difference in the materials‘ workfunctions. Furthermore, short-range interdiffusion of Ca and Y cations is observed. These charge transfer processes establish doping gradients in the interfacial region capable of affecting both the polaronic transport in the manganite and the characteristics of the superconductivity.