Dresden 2009 – scientific programme

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O: Fachverband Oberflächenphysik

O 27: Poster Session I (Methods: Scanning probe techniques; Methods: Atomic and electronic structure; Methods: Molecular simulations and statistical mechanics; Oxides and Insulators: Clean surfaces; Oxides and Insulators: Adsorption; Oxides and Insulators: Epitaxy and growth; Semiconductor substrates: Clean surfaces; Semiconductor substrates: Epitaxy and growth; Semiconductor substrates: Adsorption; Nano- optics of metallic and semiconducting nanostructures; Electronic structure; Methods: Electronic structure theory; Methods: other (experimental); Methods: other (theory); Solutions on surfaces; Epitaxial Graphene; Surface oder interface magnetism; Phase transitions; Time-resolved spectroscopies)

O 27.5: Poster

Tuesday, March 24, 2009, 18:30–21:00, P2

Development of a combined AFM-STM for measurements under transport conditions and at low temperatures — •Jan Raphael Bindel, Marcus Liebmann, and Markus Morgenstern — II. Physikalisches Institut B, RWTH Aachen and JARA-FIT, Otto-Blumenthal-Straße, 52074 Aachen

We present a microscope combining atomic force (AFM) and scanning tunneling microscopy (STM) capabilities using a tuning fork. The device allows the investigation of a sample by AFM and to take STM images on spots of interest.

To use the full scope of the microscope, it is equipped with an xy drive which has a traverse path of 2 mm x 2 mm. Furthermore, the microscope can operate in two different modes, the AFM-STM constellation which makes it possible to apply a gate voltage on the sample and the pure STM mode, in which four point transport measurements can be done simultaneously with scanning.

The whole concept allows the usage in ultra high vacuum (UHV), at low temperatures down to 300 mK and in magnetic fields up to 14 T. Therefore, it has a compact symmetric design with a diameter of only 30 mm, which guarantees stability and high resonance frequencies. First test measurements of the microscope are presented.