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Verhandlungen
Verhandlungen
DPG

Dresden 2009 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 27: Poster Session I (Methods: Scanning probe techniques; Methods: Atomic and electronic structure; Methods: Molecular simulations and statistical mechanics; Oxides and Insulators: Clean surfaces; Oxides and Insulators: Adsorption; Oxides and Insulators: Epitaxy and growth; Semiconductor substrates: Clean surfaces; Semiconductor substrates: Epitaxy and growth; Semiconductor substrates: Adsorption; Nano- optics of metallic and semiconducting nanostructures; Electronic structure; Methods: Electronic structure theory; Methods: other (experimental); Methods: other (theory); Solutions on surfaces; Epitaxial Graphene; Surface oder interface magnetism; Phase transitions; Time-resolved spectroscopies)

O 27.8: Poster

Dienstag, 24. März 2009, 18:30–21:00, P2

Controlled nanoparticle manipulation along defined vector pathways — •Michael Feldmann, Dirk Dietzel, and André Schirmeisen — Institute of Physics and Center for Nanotechnology, University of Münster, Germany

Manipulation of nanoparticles with an atomic force microscope (AFM) is a very promising approach to measure friction of nanoscale objects with well defined contact area. For example, the phenomenon of frictional duality was revealed for Sb nanoparticles on graphite in vacuum [1]. However, so far the manipulation was performed during conventional image scanning with a commercial AFM control unit [2]. To optimize the control over the manipulation process a new AFM control system has been developed. This system enables AFM tip translations along arbitrary programmable vector pathways while allowing to select distinct control parameters like normal force and velocity for each single vector. Due to the systems ability to simultaneously record the lateral force along the x axis, it is thus possible to conduct nanotribological experiments with individually chosen nanoparticles in a highly controlled and reproducible fashion.

[1] Dietzel et al., Phys. Rev. Lett., 101, 125505 (2008)

[2] Dietzel et al., J. Appl. Phys., 102, 84306 (2007)

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