Dresden 2009 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 27: Poster Session I (Methods: Scanning probe techniques; Methods: Atomic and electronic structure; Methods: Molecular simulations and statistical mechanics; Oxides and Insulators: Clean surfaces; Oxides and Insulators: Adsorption; Oxides and Insulators: Epitaxy and growth; Semiconductor substrates: Clean surfaces; Semiconductor substrates: Epitaxy and growth; Semiconductor substrates: Adsorption; Nano- optics of metallic and semiconducting nanostructures; Electronic structure; Methods: Electronic structure theory; Methods: other (experimental); Methods: other (theory); Solutions on surfaces; Epitaxial Graphene; Surface oder interface magnetism; Phase transitions; Time-resolved spectroscopies)

O 27.95: Poster

Dienstag, 24. März 2009, 18:30–21:00, P2

Unifit 2009 - Spectrum Processing, Analysis and Presentation Software for Photoelectron Spectra — •Ronald Hesse, Peter Streubel, Rüdiger Szargan, and Reinhard Denecke — Wilhelm-Ostwald-Institut, Universität Leipzig, 04103 Leipzig, Deutschland

The aim of the development of the program UNIFIT is to enable complete qualitative and quantitative analysis of photoelectron spectroscopy data by combining appropriate description of the spectra and their background using adequate models, convenient data handling, and excellent numerical performance for fast calculation with versatile opportunities for data transfer, comfortable handling, extensive graphical design options and fast export of high resolution graphics. To demonstrate the abilities, some major features will be addressed: (i) The three commonly applied models for fitting photoelectron spectra, i.e. product, sum, and convolution of Gaussian and Lorentzian functions, will be discussed. (ii) Improved methods for determination of valence-band edges are implemented. (iii) The determination of the transmission functions T(E) of any photoelectron spectrometer will be shown. (iv) The batch-processing submenu serves as a fast and comfortable treatment of parameter-dependent experimental series. (v) UNIFIT permits the calculation of fit-parameter errors after peak fitting. (vi) The software offers nine different presentations.