Dresden 2009 – wissenschaftliches Programm

Bereiche | Tage | Auswahl | Suche | Downloads | Hilfe

O: Fachverband Oberflächenphysik

O 47: Methods: Scanning probe techniques II

O 47.7: Vortrag

Donnerstag, 26. März 2009, 12:00–12:15, SCH A316

HarmoniX microscopy: A new scanning probe microscopy technique for high resolution mapping of material properties — •Udo Volz — Veeco Instruments GmbH Dynamostraße 19 D-68165 Mannheim

HarmoniX microscopy is a brand new mode of Scanning Probe Microscopy which provides fast and high resolution nanoscale mapping of material properties such as elasticity, adhesion, and dissipation. HarmoniX imaging utilizes special Tapping Mode probes that are designed for high bandwidth measurements of the forces acting on the probe tip. The variation in tip-sample forces during one period of the tapping oscillation is reconstructed by analyzing the full spectrum of motion of the probe. From the measured force-distance curves the material properties of the sample are then determined independently for each pixel of the image. HarmoniX microscopy is working at typical Tapping Mode imaging speeds and is thus hundreds of times faster than other quantitative material mapping techniques such as force volume imaging, but it retains the high resolution, non-destructive qualities of Tapping Mode Imaging.