Dresden 2009 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 66: Organic, polymeric, biomolecular films – also with absorbates II
O 66.4: Vortrag
Freitag, 27. März 2009, 12:00–12:15, SCH A316
Infrared spectroscopic ellipsometry for characterization of functionalized thin films — •D.M. Rosu1, G. Sun1, X. Zhang2, J. Rappich2, J. Jones3, J.W.P. Hsu3, U. Schade4, N. Esser1, and K. Hinrichs1 — 1Institute for Analytical Sciences, Albert-Einstein-Str. 9, 12489 Berlin, Germany — 2Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Kekuléstrasse 5, 12489 Berlin, Germany — 3Sandia National Laboratories, Albuquerque, New Mexico 87185- 1120 — 4Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Albert-Einstein-Str. 15, 12489 Berlin, Germany
Organic thin films present a high interest due to their potential use in a large variaty of applications: biosensors, microelectronical and optical devices. In the current work Infrared Spectroscopic Ellipsometry was used for chemical and structural characterisation of biofunctional surfaces as well as for investigation of the lateral homogeneity of organic monolayers for GaAs hybrid diodes[1]. The samples were studied using a lab FTIR ellipsometer and the FTIR synchrotron mapping ellipsometer located at the IR beamline at BESSY II[2]. The mapping system enables investigation of heterogeneous samples with monolayer sensitivity and a lateral resolution below 1 mm2. Besides the molecular identification, evaluation of the measured spectra with simulations using optical layer models gives informations about thickness, homogeneity and orientation of the molecules.
[1] D.M. Rosu, et al., Langmuir, in print [2] M. Gensch, et al., Infrared Phys. and Techn. 49 (1-2) (2006) 39-44