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Dresden 2009 – wissenschaftliches Programm

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TT: Fachverband Tiefe Temperaturen

TT 16: Correlated Electrons: Low-dimensional Systems - Materials 1

TT 16.11: Vortrag

Dienstag, 24. März 2009, 12:30–12:45, HSZ 304

Resonant soft x-ray scattering studies of buried interfaces — •Jochen Geck1,2, Hiroki Wadati2, Enrico Schierle3, P. Kommissinskiy4, L. Alff4, D.G. Hawthorn5, T. Higuchi6, Y. Hikita6, H.Y. Hwang6, S.-W. Huang7, D.J. Huang7, H.-J. Lin7, L.H. Tjeng8, H.-H. Wu7,8, E. Weschke3, C. Schüßler-Langeheine8, and G.A. Sawatzky21IFW Dresden, Germany — 2University of British Columbia, Canada — 3Helmholtz-Zentrum Berlin, Germany — 4University of Technology Darmstadt, Germany — 5University of Waterloo, Canada — 6University of Tokyo, Japan — 7National Synchrotron Radiation Research Center, Taiwan — 8University of Cologne, Germany

Resonant soft x-ray scattering (RSXS) is a unique experimental tool to access the electronic properties of buried interfaces in heterostructures that contain transition metal oxides. In this contribution, studies of SrTiO3/LaAlO3, SrTiO3/(La,Ca)MnO3 and NdGaO3/(La,Ca)MnO3 interfaces are presented. Specifically, RSXS was employed to examine the electronic reconstruction of Ti 3d and O 2p valence states at the interfaces of SrTiO3/LaAlO3 superlattices. Similarly, we used resonant soft x-ray reflectivity to investigate the electronic structure at the interfaces of SrTiO3/(La,Ca)MnO3 and NdGaO3/(La,Ca)MnO3 thin film systems.

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