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Q: Fachverband Quantenoptik und Photonik
Q 12: Laserentwicklung: Festkörperlaser III
Q 12.6: Talk
Monday, March 2, 2009, 17:45–18:00, VMP 6 HS-C
Spatially resolved x-ray diffraction measurements of stress-induced fs-laser written YAG waveguides — •Oliver Henneberg1, Ralf Menzel1, Robert Elsner1, Dietmar Korn1, Jörg Siebenmorgen2, and Günter Huber2 — 1Universität Potsdam, Institut für Physik und Astronomie, Potsdam, Deutschland — 2Universität Hamburg, Institut für Laser-Physik, Hamburg, Deutschland
Homogeneous Nd:YAG crystals are widely used as an active medium in solid state lasers. Tracks of material damage were inscribed in YAG crystals using a fs-laser system. Due to a stress-induced change of the refractive index waveguiding is possible in different channels in the surrounding region of the written tracks. The diameter of the waveguides is about 20 µm.
In order to get more detailed information about the waveguide and its surrounding area spatially resolved x-ray diffraction measurements have been performed at the synchrotron HASYLAB. YAG with its cubic symmetry has a lattice constant of a = 1.2 nm. Selecting a bragg peak from the diffraction pattern, we compared the distorted and undistorted material. First results show a slightly shifted position of that bragg peak in the waveguide compared to undistorted YAG, indicating a change of the lattice constant of the material. A detailed discussion of the results will be given at the conference.