Bonn 2010 – wissenschaftliches Programm
HK 36.37: Poster
Mittwoch, 17. März 2010, 14:00–16:00, HG Aula
Beam Induced Fluorescence Profile Monitor for High Current Heavy Ion Beams — Christiane Andre, Frank Becker, •Peter Forck, Rainer Haseitl, and Beata Walasek-Höhne — GSI, Darmstadt
For intense heavy ion beams, as delivered by the GSI linear accelerator UNILAC and by the planned Facility for Antiproton and Ion Research (FAIR), a non-intercepting method for transverse beam profile determination is required. A new diagnostic device, the Beam Induced Fluorescence Monitor (BIF), operating at a single-shot basis was developed and installed at several locations along the UNILAC. Fluorescence light (single photons) emitted due to atomic collisions between the heavy ion beam and the residual gas are detected by an image intensified camera system to measure beam profiles. Beam induced fluorescence spectra of nitrogen and various rare gases were investigated with the result that N2 as working gas shows the best overall performance.