Bonn 2010 – wissenschaftliches Programm
HK 68.7: Vortrag
Freitag, 19. März 2010, 15:35–15:50, HG ÜR 4
Electro-optic bunch diagnostic at FLASH — •Laurens Wißmann1, Sebastian Schulz1, Bernhard Schmidt2, Vladimir Arsov3, and Bernd Steffen3 — 1University of Hamburg, Hamburg, Germany — 2DESY, Hamburg, Germany — 3PSI, Villigen, Switzerland
Free electron lasers (FELs) require a variety of beam diagnostics for stable lasing operation. Among these, longitudinal electron bunch diagnostic at different locations is mandatory to monitor the compression of the electron bunches. Electro-optic techniques offer a non-destructive way to investigate the arrival time and profile of potentially every bunch in a bunch train. Two different setups with distinct advantages are being used or installed at FLASH, ranging from a robust system with low resolution to a versatile experimental area allowing various tests and development of new technologies.