Bonn 2010 – wissenschaftliches Programm

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T: Fachverband Teilchenphysik

T 82: Beschleunigerphysik V

T 82.7: Vortrag

Freitag, 19. März 2010, 15:35–15:50, HG ÜR 4

Electro-optic bunch diagnostic at FLASH — •Laurens Wißmann1, Sebastian Schulz1, Bernhard Schmidt2, Vladimir Arsov3, and Bernd Steffen31University of Hamburg, Hamburg, Germany — 2DESY, Hamburg, Germany — 3PSI, Villigen, Switzerland

Free electron lasers (FELs) require a variety of beam diagnostics for stable lasing operation. Among these, longitudinal electron bunch diagnostic at different locations is mandatory to monitor the compression of the electron bunches. Electro-optic techniques offer a non-destructive way to investigate the arrival time and profile of potentially every bunch in a bunch train. Two different setups with distinct advantages are being used or installed at FLASH, ranging from a robust system with low resolution to a versatile experimental area allowing various tests and development of new technologies.

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