Hannover 2010 – wissenschaftliches Programm
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A: Fachverband Atomphysik
A 28: Attosecond Physics II / Interaction with Strong or Short Laser Pulses III
A 28.5: Vortrag
Freitag, 12. März 2010, 15:00–15:15, F 107
Ion Microscopy with XUV-Radiation at FLASH — •Boris Bergues1, Martin Schultze1, Matthias Kling1, Oliver Herrwerth1, Adrian Wirth1, Wolfram Helml1, Matthias Lezius1, Gilad Marcus1, Michael Hofstetter1, Peter Lang1, Reinhard Kienberger1, Karl-Ludwig Kompa1, Ferenc Krausz1, Artem Rudenko2, Kai-Uwe Kühnel3, Claus Dieter Schröter3, Robert Moshammer3, Joachim Ullrich3, Rolf Treusch4, Stefan Düsterer4, and Hartmut Schröder1 — 1Max-Planck-Institut für Quantenoptik, Garching, Germany. — 2Max-Planck Advanced Study Group at CFEL, Hamburg, Germany. — 3Max-Planck-Institut für Kernphysik, Heidelberg, Germany. — 4HASYLAB at DESY, Hamburg, Germany.
A novel technique is presented, that allows a spatially resolved photoionization-yield measurement of gas-phase ions created in the interaction volume of an intense-laser focus. The method termed 'ion microscopy' thus overcomes the limitations usually imposed by the integration of the ion yield over the focal volume. Moreover, the new technique represents a precise tool for non invasive, in situ focus diagnostics and is applied to characterize the focal geometry of focused XUV-radiation generated at the FLASH facility in Hamburg.