Hannover 2010 – wissenschaftliches Programm

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Q: Fachverband Quantenoptik und Photonik

Q 54: Laser Applications: Optical Measurement Technology I

Q 54.3: Vortrag

Donnerstag, 11. März 2010, 14:30–14:45, F 342

Verification of Optical Diameter Measurement of Subwavelength-Diameter Optical Fibres using Scanning Electron Microscopy — •Dimitri Pritzkau, Konstantin Karapetyan, Ulrich Wiedemann, Cristian Dan, Wolfgang Alt, and Dieter Meschede — Institut für Angewandte Physik, Wegelerstr. 8, 53115 Bonn

Subwavelength-diameter optical fibres (SDOF) are widely used in linear optics and they are a promising tool for nonlinear optical applications. The diameter of an SDOF (300 - 1000 nm) is a main parameter in controlling nonlinear effects. Several optical measurement techniques exist, which are usually verified by scanning electron microscopy (SEM). For submicrometer metrology SEM is a convenient method but typically limited to 10 % uncertainty. We developed a new optical measurement method with improved accuracy. To validate this method, a precision of about 2 % is needed. In this talk we discuss the SEM measurement requirements (including fibre preparation, electron-fibre interaction and advanced analysis software) to achieve this goal.