Hannover 2010 – wissenschaftliches Programm

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SYPS: Symposium Precision spectroscopy of highly ionized matter

SYPS 1: Precision spectroscopy of highly ionized matter I

SYPS 1.3: Hauptvortrag

Freitag, 12. März 2010, 12:00–12:30, A 001

Diagnostic of Hot Dense Plasmas by Advanced XUV and X-ray Spectroscopy — •Ingo Uschmann — Institut für Optik und Quantenelektronik, Friedrich-Schiller-Universität, 07743 Jena, Germany

Hot and dense plasmas are currently investigated for their importance both as ultrashort, bright XUV and x-ray sources and in the context of Inertial Confinement Fusion. The development of high intensity- and high power laser systems as well as short wavelength Free-Electron Lasers has provided the means to create laboratory plasmas with high temperatures and nearly solid density. These kinds of plasma emit intense x-ray emission resulting from recombination or interaction of the hot electrons and ions within the material. Analysis of these x-rays provides important information about the laser-matter interaction, yielding fundamental plasma parameters such as density, temperature, their spatial gradients, and the strength of local electromagnetic fields. High performance XUV mirrors and gratings as well as a combination of Bragg-reflection from crystals with bent surfaces allow spatially resolved imaging of keV x-ray emission in selected spectral ranges. Spherically or toroidally bent crystals provide either two dimensional images or focused x-ray spectra combined with a spatial resolution. Applications of high-resolution XUV- and x-ray spectroscopy will be presented to study energy coupling of fast electrons or intense XUV pulses to solid density plasma, providing detailed information on environmental conditions in hot dense plasmas.