Regensburg 2010 – scientific programme
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DS: Fachverband Dünne Schichten
DS 29: Poster: Molecular Spintronics, Biomolecular and Functional Organic Layers, Organic Electronics and Photovoltaics, Plasmonics and Nanophotonics, Organic Thin Films, Nanoengineered Thin Films, Thin Film Characterisation,
DS 29.18: Poster
Wednesday, March 24, 2010, 15:00–17:30, Poster A
Infrared spectroscopic ellipsometry of organic semiconductor layers — •Robert Lovrinčić, Jens Trollmann, and Annemarie Pucci — Kirchhoff-Institut für Physik der Universität Heidelberg
Organic semiconductors are very interesting for many applications as they are printable on a variety of substrates in large areas and at low costs. Within the production process many steps are necessary which might influence the chemical composition of the material and thereby the electrical performance of the device. Chemical information can be obtained from spectroscopic measurements in the mid infrared (fingerprint region).
We perform variable angle infrared spectroscopic ellipsometry to determine the dielectric function of organic semiconductor layers in the spectral region 350−5000 cm−1 by means of a commercial IR-ellipsometer (Woollam IR-VASE). The anisotropy of the resulting dielectric function will be discussed. Moreover, by changing the sample temperature during measurement the stability of the semiconductor can be investigated.