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Regensburg 2010 – scientific programme

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KR: Fachverband Kristallographie

KR 2: Crystallography in nanoscience

KR 2.8: Talk

Tuesday, March 23, 2010, 12:00–12:15, H9

Polarization dependent Diffraction Anomalous Fine Structure of rutile TiO2 001 and 111 reflections
— •Matthias Zschornak1,2, Carsten Richter1, Hartmut Stöcker1, Tilmann Leisegang1, Sibylle Gemming2, and Dirk C. Meyer1,31Nachwuchsgruppe Nanostrukturphysik, Institute of Structural Physics, TU Dresden, Germany — 2Institute of Ion Beam Physics and Materials Research, FZ Dresden-Rossendorf, Germany — 3Institute of Experimental Physics, TU Bergakademie Freiberg, Germany

Energy and polarization dependent Diffraction Anomalous Fine Structure (DAFS) also known as Anisotropic Anomalous Scattering (AAS) can be employed in addition to X-ray Absorption Fine Structure (XAFS) to study electronic transitions from core states to unoccupied states. Here, we present results from resonant X-ray diffraction experiments on TiO2 rutile, space group (136) P42/mnm. For this model structure, site symmetry information was extracted from determination of the structure factor tensor by refining elements of Ti atomic scattering factor tensors. Influences of oxygen vacancies on the anomalous scattering contributions have been studied on a series of rutile wafers of different oxygen concentration. Samples investigated were 10 × 10 × 1 mm3 single crystal wafers and experiments were carried out at DESY/HASYLAB beamlines C and E2 using a Si (111) double crystal monochromator in the vicinity of the Ti-K absorption edge. Considered reflections include the ‘forbidden’ 001 and allowed 111 reflection.

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